Development of Biaxial Tensile Test System for in-situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis

被引:0
|
作者
Kubo, Masahiro [1 ,2 ]
Yoshida, Hiroshi [3 ]
Uenishi, Akihiro [1 ]
Suzuki, Seiichi [4 ]
Nakazawa, Yoshiaki [1 ]
Hama, Takayuki [2 ]
Takuda, Hirohiko [2 ]
机构
[1] Nippon Steel & Sumitomo Met Corp, Res & Dev Bur, 5-3 Tokai, Tokai, Aichi 4768686, Japan
[2] Kyoto Univ, Grad Sch Energy, Kyoto, Japan
[3] Nippon Steel & Sumitomo Met Corp, Nagoya Works, Tokai, Aichi, Japan
[4] TSL Solut Ltd, Osaka, Japan
关键词
in-situ observation; interstitial-free steel; electron back scatter diffraction patterns; scanning electron microscope; biaxial tensile test; cruciform specimen; finite element analysis; FORMING LIMIT; SHEET METALS; SURFACE; DEFORMATION; MECHANISM; TEXTURE; STRAINS; DESIGN;
D O I
10.2355/tetsutohagane.TETSU-2018-122
中图分类号
TF [冶金工业];
学科分类号
0806 ;
摘要
For the further improvement of the press formability of steel sheets, it is important to clarify the relationship between macro mechanical properties and microstructure under multi-axial deformation state. The objective of this work is to develop the experimental system of in-situ observation and analysis for biaxial tensile deformation using electron back scatter diffraction patterns (EBSD) with scanning electron microscope (SEM). The appropriate shape of cruciform specimen for the system was examined first by using finite element analysis, and the biaxial tensile test system in vacuum SEM chamber was developed. In-situ observation of microstructure during equibiaxial tensile deformation was then conducted using the developed system and the proposed cruciform specimen. The material used in this study was an interstitial-free steel. It was validated by the comparison with the results obtained by the Marciniak type macro test that the developed system realized equibiaxial tensile deformation. Finally, some information obtained from SEM and EBSD analysis was illustrated. It was found for example that the grains with {001 } plane orientations deformed easily and might cause the surface roughness.
引用
收藏
页码:86 / 95
页数:10
相关论文
共 50 条
  • [1] Development of Biaxial Tensile Test System for In-situ Scanning Electron Microscope and Electron Backscatter Diffraction Analysis
    Kubo, Masahiro
    Yoshida, Hiroshi
    Uenishi, Akihiro
    Suzuki, Seiichi
    Nakazawa, Yoshiaki
    Hama, Takayuki
    Takuda, Hirohiko
    [J]. ISIJ INTERNATIONAL, 2016, 56 (04) : 669 - 677
  • [2] Review Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis
    K. Z. Baba-Kishi
    [J]. Journal of Materials Science, 2002, 37 : 1715 - 1746
  • [3] Review - Electron backscatter Kikuchi diffraction in the scanning electron microscope for crystallographic analysis
    Baba-Kishi, KZ
    [J]. JOURNAL OF MATERIALS SCIENCE, 2002, 37 (09) : 1715 - 1746
  • [4] In-situ scanning electron microscopy and electron backscatter diffraction investigation on the oxidation of pure iron
    Poeter, B.
    Parezanov, I.
    Spiegel, M.
    [J]. MATERIALS AT HIGH TEMPERATURES, 2005, 22 (3-4) : 185 - 193
  • [5] Characterization of Portland cement clinker by Electron Backscatter Diffraction (EBSD) analysis in the Scanning Electron Microscope (SEM)
    Roessler, Christiane
    Moeser, Bernd
    Ludwig, Horst-Michael
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2017, 253
  • [6] In-situ fracturing of wood in the scanning electron microscope
    Bodner, J
    Grull, G
    Schlag, MG
    [J]. HOLZFORSCHUNG, 1996, 50 (06) : 487 - 490
  • [7] Development and application of a high-temperature imaging system for in-situ scanning electron microscope
    Zhang, Yixu
    Tang, Liang
    Wang, Yongfeng
    Wang, Jin
    Zhou, Jianli
    Lu, Junxia
    Zhang, Yuefei
    Zhang, Ze
    [J]. MATERIALS TODAY COMMUNICATIONS, 2024, 38
  • [8] Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope
    Trager-Cowan, C.
    Alasmari, A.
    Avis, W.
    Bruckbauer, J.
    Edwards, P. R.
    Hourahine, B.
    Kraeusel, S.
    Kusch, G.
    Jablon, B. M.
    Johnston, R.
    Martin, R. W.
    Mcdermott, R.
    Naresh-Kumar, G.
    Nouf-Allehiani, M.
    Pascal, E.
    Thomson, D.
    Vespucci, S.
    Mingard, K.
    Parbrook, P. J.
    Smith, M. D.
    Enslin, J.
    Mehnke, F.
    Kneissl, M.
    Kuhn, C.
    Wernicke, T.
    Knauer, A.
    Hagedorn, S.
    Walde, S.
    Weyers, M.
    Coulon, P-M
    Shields, P. A.
    Zhang, Y.
    Jiu, L.
    Gong, Y.
    Smith, R. M.
    Wang, T.
    Winkelmann, A.
    [J]. EMAS 2019 WORKSHOP - 16TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS, 2020, 891
  • [9] Rotation contour contrast reconstruction using electron backscatter diffraction in a scanning electron microscope
    [J]. Gauvin, Raynald, 1600, International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (48):
  • [10] Rotation contour contrast reconstruction using electron backscatter diffraction in a scanning electron microscope
    Kaboli, Shirin
    Demers, Hendrix
    Brodusch, Nicolas
    Gauvin, Raynald
    [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015, 48 : 776 - 785