Simulation of thermal behavior in high-precision measurement instruments

被引:2
|
作者
Weis, Hanna Sophie [1 ]
Augustin, Silke [1 ]
机构
[1] Tech Univ Ilmenau, Inst Prozessmess & Sensortech, D-98684 Ilmenau, Germany
关键词
black box; changes of the refractive index due to vicinity influences; control volume; modularization of complex finite-element models; temperature fields in high-precision measurement instruments;
D O I
10.1007/s10765-007-0365-x
中图分类号
O414.1 [热力学];
学科分类号
摘要
In this paper, a way to modularize complex finite-element models is described. The modularization is done with temperature fields that appear in high-precision measurement instruments. There, the temperature negatively impacts the achievable uncertainty of measurement. To correct for this uncertainty, the temperature must be known at every point. This cannot be achieved just by measuring temperatures at specific locations. Therefore, a numerical treatment is necessary. As the system of interest is very complex, modularization is unavoidable to obtain good numerical results.
引用
收藏
页码:1184 / 1192
页数:9
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