Cavity-enhanced direct frequency comb spectroscopy

被引：1

作者：

Reyes-Reyes, A. ^{[1
]}

Zeitouny, M. G. ^{[1
]}

van Mastrigt, E. ^{[2
]}

Persijn, S. T. ^{[3
]}

Bhattacharya, N. ^{[1
]}

Urbach, H. P. ^{[1
]}

机构：

[1] Delft Univ Technol, Fac Sci Appl, IST Dept, Opt Res Grp, POB 5046, NL-2600 GA Delft, Netherlands

[2] Erasmus MC Sophia Childrens Hosp, Dept Pediat Pulmonol, NL-3015 GJ Rotterdam, Netherlands

[3] VSL, NL-2600 AR Delft, Netherlands

来源：

22ND CONGRESS OF THE INTERNATIONAL COMMISSION FOR OPTICS: LIGHT FOR THE DEVELOPMENT OF THE WORLD | 2011年 / 8011卷

关键词：

VIPA spectroscopy; Frequency comb spectroscopy; Trace gas detection; IMAGED PHASED-ARRAY; DISPERSION;

D O I：

10.1117/12.902127

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A Cavity-Enhanced Direct Frequency Comb Spectroscopy (CE-DFCS) setup developed in our laboratory is described. We focus on the broadband spectrometer which is based on a Virtually Imaged Phased Array (VIPA). It can detect 3500 independent channels simultaneously, covering a bandwidth of 20 nm with a resolution of 800 MHz around a central frequency of 1.5 mu m in a few microseconds. The bandwidth can be extended to 200 nm by rotating the grating of the VIPA spectrometer.

引用

页数：7

共 50 条

[1] Cavity-enhanced direct frequency comb spectroscopy
Thorpe, M. J.
Ye, J.
APPLIED PHYSICS B-LASERS AND OPTICS, 2008, 91 (3-4): : 397 - 414
[2] Cavity-enhanced direct frequency comb spectroscopy
M.J. Thorpe
J. Ye
Applied Physics B, 2008, 91 : 397 - 414
[3] Cavity-Enhanced Direct Frequency Comb Spectroscopy: Technology and Applications
Adler, Florian
Thorpe, Michael J.
Cossel, Kevin C.
Ye, Jun
ANNUAL REVIEW OF ANALYTICAL CHEMISTRY, VOL 3, 2010, 3 : 175 - 205
[4] Cavity-Enhanced Frequency Comb Vernier Spectroscopy
Lu, Chuang
Morville, Jerome
Rutkowski, Lucile
Senna Vieira, Francisco
Foltynowicz, Aleksandra
PHOTONICS, 2022, 9 (04)
[5] Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
K. C. Cossel
F. Adler
K. A. Bertness
M. J. Thorpe
J. Feng
M. W. Raynor
J. Ye
Applied Physics B, 2010, 100 : 917 - 924
[6] Analysis of trace impurities in semiconductor gas via cavity-enhanced direct frequency comb spectroscopy
Cossel, K. C.
Adler, F.
Bertness, K. A.
Thorpe, M. J.
Feng, J.
Raynor, M. W.
Ye, J.
APPLIED PHYSICS B-LASERS AND OPTICS, 2010, 100 (04): : 917 - 924
[7] Cavity-Enhanced Direct Optical Frequency Comb Spectroscopy with Tooth-Width Limited Resolution
Charczun, Dominik
Kowzan, Grzegorz
Nishiyama, Akiko
Staniszewski, Przemyslaw
Cygan, Agata
Lisak, Daniel
Trawinski, Ryszard S.
Maslowski, Piotr
2019 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO), 2019,
[8] Tomography of a supersonically cooled molecular jet using cavity-enhanced direct frequency comb spectroscopy
Thorpe, Michael J.
Adler, Florian
Cossel, Kevin C.
de Miranda, Marcio H. G.
Ye, Jun
CHEMICAL PHYSICS LETTERS, 2009, 468 (1-3) : 1 - 8
[9] Noise-immune cavity-enhanced optical frequency comb spectroscopy
Khodabakhsh, Amir
Abd Alrahman, Chadi
Foltynowicz, Aleksandra
OPTICS LETTERS, 2014, 39 (17) : 5034 - 5037
[10] Noise-immune cavity-enhanced optical frequency comb spectroscopy
Foltynowicz, Aleksandra (aleksandra.foltynowicz@physics.umu.se), 1600, Optical Society of America (OSA) (39):

← 1 2 3 4 5 →