Dark noise currents and energy resolution of CdZnTe spectrometers

被引：12
|
作者：
Nemirovsky, Y [1 ]
Asa, G [1 ]
Jakobson, CG [1 ]
Ruzin, A [1 ]
Gorelik, J [1 ]
机构：
[1] Technion Israel Inst Technol, Dept Elect Engn, Kidron Microelect Res Ctr, IL-32000 Haifa, Israel
来源：
JOURNAL OF ELECTRONIC MATERIALS | 1998年 / 27卷 / 06期
关键词：
CdZnTe; noise currents; x-ray and gamma-ray detectors;
D O I：
10.1007/s11664-998-0056-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The effect on energy resolution of dark noise currents experimentally observed ill state of the art CdZnTe spectrometers is quantitatively analyzed. Expressions for the energy resolution determined by shot noise, generation-recombination noise, and 1/f noise are discussed in turn and are compared with the linewidth due to incomplete charge collection. The effect of the dark noise upon energy resolution is directly measured by monitoring the broadening of peaks provided by a pulser, due to biased, non-irradiated CdZnTe spectrometers that are connected in parallel. The noise characteristics of the spectrometers under study were measured separately and their dominant noise mechanism is characterized. In this manner, the effect on resolution of the dark noise is correlated not only with the dc value of the dark current but also with the noise spectral behavior which is determined by the noise mechanism.
引用
收藏
页码：800 / 806
页数：7
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