Simultaneous multiple degrees of freedom (DoF) measurement system

被引:14
|
作者
Molnar, G. [1 ]
Strube, S. [1 ]
Koechert, P. [1 ]
Danzebrink, H-U [1 ]
Fluegge, J. [1 ]
机构
[1] Phys Tech Bundesanstalt, Bundesallee 100, D-38116 Braunschweig, Germany
关键词
optical metrology; positioning stages; multi-axis measurement; interferometry; DFT; INTERFEROMETER;
D O I
10.1088/0957-0233/27/8/084011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents a newly developed highly accurate interferometric 6 degrees of freedom (DoF) measurement system with Angstrom resolution for displacement and mu rad resolution for angle measurement, respectively. The new interferometer is based on a modified homodyne Twyman-Green interferometer concept. It uses a novel signal acquisition and processing approach whereby a spatial interferogram is captured by a CMOS camera and the registered fringe pattern is transformed into its frequency spectrum [1]. The spectral representation of a movement of e.g. a positioning stage is analyzed for its major components: the phase information directly correlates with the displacement of the stage, while a possible rotational motion causes a shift in the frequency spectrum. The developed compact 6 DoF head uses multiple rays in parallel to detect x-y-z displacements and roll-pitch-yaw movements.
引用
收藏
页数:8
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