Metal Based Nonvolatile Field-Effect Transistors

被引:13
|
作者
Bi, Chong [1 ]
Xu, Meng [1 ]
Almasi, Hamid [1 ]
Rosales, Macus [1 ]
Wang, Weigang [1 ]
机构
[1] Univ Arizona, Dept Phys, Tucson, AZ 85721 USA
基金
美国国家科学基金会;
关键词
ELECTROCHEMICAL REDUCTION; GRAPHENE FILMS; DIOXIDE; STORAGE; OXIDE;
D O I
10.1002/adfm.201600048
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
The reduction of metals from their oxides through solid electrochemical reactions usually requires a high temperature above 800 degrees C and a specially designed electrochemical structure. It is demonstrated that, in a simple field-effect transistor (FET) structure, the redox reaction between Co metal and CoOx is reversible under a small electric field and can be achieved at a moderate temperature below 200 degrees C. The FETs functioning through the reversible redox reaction show nonvolatile behavior and a high on/off ratio of about 10(5). Moreover, the FETs show a threshold resistance switching behavior at high resistance states, but with opposite switching directions compared to normal metal/oxide/metal structures. The electric field induced metal-oxide transition may also be used for other energy storage applications.
引用
收藏
页码:3490 / 3495
页数:6
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