Open-Transistor Fault Detection and Diagnosis Based on Current Trajectory in a Two-level Voltage Source Inverter

被引:16
|
作者
Raj, Nithin [1 ]
Mathew, Jose [2 ]
Jagadanand, G. [1 ]
George, Saly [1 ]
机构
[1] NIT Calicut, Dept Elect Engn, Kozhikode 673601, India
[2] Honeywell Technol Solut Labs, Global Analyt & Legal Serv, Bangalore 560048, Karnataka, India
关键词
Current trajectory; Fault detection; Fault diagnosis; Open-transistor fault; Voltage source inverter;
D O I
10.1016/j.protcy.2016.08.159
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Even though technological developments in the area of control of voltage source inverter (VSI) have reached a relatively matured state, advances in improving the reliability of VSI is still a developing area. In order to improve safety as well as reliable operation, an effective fault detection and diagnosis method has to be integrated along with the control of inverter-fed systems. In this paper, implementation of open-transistor fault detection and diagnosis in VSI is presented. The current trajectory of phase currents is employed to detect the fault condition and identify the faulty switch. Implementation of this method in a three-phase two-level VSI with the aid of data acquisition card and LabVIEW software is presented with the experimental result. (C) 2015 The Authors. Published by Elsevier Ltd.
引用
收藏
页码:669 / 675
页数:7
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