Nd:YAG laser irradiation effects on electrical properties of polycrystalline Li0.5Fe2.5O4

被引:1
|
作者
Mane, Maheshkumar L. [1 ]
Dhage, V. N. [1 ]
Shirsath, Sagar E. [1 ]
Sundar, R. [2 ]
Ranganathan, K. [2 ]
Oak, S. M. [2 ]
Jadhav, K. M. [1 ]
机构
[1] Dr Babasaheb Ambedkar Marathwada Univ, Dept Phys, Aurangabad 431004, MS, India
[2] Raja Ramanna Ctr Adv Technol, Solid State Laser Div, Indore, India
关键词
Laser irradiation; Li-ferrite; Conduction mechanism; Infrared spectroscopy; DIELECTRIC-PROPERTIES; MAGNETIC-PROPERTIES; LITHIUM FERRITE; INFRARED SPECTRA; ION IRRADIATION; AL;
D O I
10.1016/j.jallcom.2011.08.100
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The polycrystalline spinel structured Li0.5Fe2.5O4 ferrite have been prepared by conventional double sintering ceramic method. The samples were palletized and irradiated by Nd:YAG laser with different laser fluencies and characterized by infrared spectroscopy and DC electrical resistivity in order to obtain phase, crystal structure and conduction mechanism in pristine and irradiated samples. The infrared spectroscopy is employed to study the local symmetry and conduction mechanism in crystalline solids before and after irradiation. The DC electrical resistivity measured by two-probe technique from room temperature to beyond Curie temperature with steps of 10 K increases after laser irradiation. Variation of dielectric properties like dielectric constant and dielectric loss tangent is also measured as a function of temperature. A significant reduction in the values of dielectric constant and dielectric loss tangent has been observed with the increase of laser dose. (C) 2011 Elsevier B. V. All rights reserved.
引用
收藏
页码:31 / 34
页数:4
相关论文
共 50 条
  • [1] Effects of Nd:YAG laser irradiation on structural and magnetic properties of Li0.5Fe2.5O4
    Mane, Maheshkumar L.
    Sundar, R.
    Ranganathan, K.
    Oak, S. M.
    Jadhav, K. M.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2011, 269 (04): : 466 - 471
  • [2] Effect of Gamma Irradiation on the Physical Properties of Nanocrystalline Li0.5Fe2.5O4
    Mane, Maheshkumar L.
    Dhage, V. N.
    Aghav, P. S.
    Babrekar, M. K.
    Jadhav, K. M.
    SOLID STATE PHYSICS: PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010, PTS A AND B, 2011, 1349 : 1131 - 1132
  • [3] Mossbauer study of Li0.5Fe2.5O4
    Oak, HN
    Baek, KS
    Yu, KS
    JOURNAL OF PHYSICS-CONDENSED MATTER, 1998, 10 (05) : 1131 - 1136
  • [4] Effect of silica matrix on structural, optical and electrical properties of Li0.5Fe2.5O4 nanoparticles
    Barde, Nilesh P.
    Shewale, Sunil S.
    Solanki, Piyush S.
    Shah, Nikesh A.
    Bardapurkar, Pranav P.
    SCRIPTA MATERIALIA, 2021, 194
  • [5] MAGNETIC-PROPERTIES OF (111) LI0.5FE2.5O4 FILMS
    MASTERSON, HJ
    LUNNEY, JG
    RAVINDER, D
    COEY, JMD
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1995, 140 : 2081 - 2082
  • [6] Structural and magnetic properties of Co substituted Li0.5Fe2.5O4
    Patil, R. P.
    Patil, S. B.
    Jadhav, B. V.
    Delekar, S. D.
    Hankare, P. P.
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2016, 401 : 870 - 874
  • [7] LINEAR MAGNETIC BIREFRINGENCE IN LI0.5FE2.5O4
    PASTOR, K
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1975, 68 (01): : K13 - K16
  • [8] ELECTRICAL RELAXATION STUDIES OF Li0.5Fe2.5O4 PREPARED BY TWO DIFFERENT TECHNIQUES
    Mohanty, Viswarupa
    Cheruku, Rajesh
    Vijayan, Lakshmi
    Govindaraj, G.
    Solid State Ionics: Ionics for Sustainable World, 2013, : 479 - 489
  • [9] Synthesis, structure and electrical conductivity studies of inverse spinel Li0.5Fe2.5O4
    Mohanty, Viswarupa
    Cheruku, Rajesh
    Vijayan, Lakshroi
    Govindaraj, G.
    INDIAN JOURNAL OF PURE & APPLIED PHYSICS, 2013, 51 (05) : 381 - 384
  • [10] Influence of Ti4+ ion substitution on structural, electrical and dielectric properties of Li0.5Fe2.5O4 nanoparticles
    Jitendra S. Kounsalye
    Prashant B. Kharat
    Mahendra V. Shisode
    K. M. Jadhav
    Journal of Materials Science: Materials in Electronics, 2017, 28 : 17254 - 17261