High-resolution Fourier transform x-ray spectroscopy

被引：4
|
作者：
Tamasaku, K [1 ]
Ishikawa, T
Yabashi, M
机构：
[1] SPring8, RIKEN, Mikazuki, Hyogo 6795148, Japan
[2] SPring8, JASRI, Mikazuki, Hyogo 6795198, Japan
来源：
APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 15期
关键词：
D O I：
10.1063/1.1618023
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Fourier transform spectroscopy was extended to the x-ray region using an intensity correlation technique and a separate crystal design of an x-ray Michelson interferometer capable of a large path difference. A demonstration was presented measuring the bandwidth of Si 0 6 14 back diffraction as narrow as 12.8 attometers at a wavelength of 71.3 pm. Insensitivity of the resolution to the crystal perfection would open up ultrahigh-resolution spectroscopy beyond 10(-9). (C) 2003 American Institute of Physics.
引用
收藏
页码：2994 / 2996
页数：3
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