Accelerated life testing on repairable systems

被引：12
|
作者：
Guérin, F [1 ]
Dumon, B [1 ]
Lantieri, P [1 ]
机构：
[1] Univ Angers, Angers, France
来源：
ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM, 2004 PROCEEDINGS | 2004年
关键词：
accelerated testing; Poisson's process; arrhenius; peck; repairable system;
D O I：
10.1109/RAMS.2004.1285472
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
In this paper, we define two accelerated life models for repairable systems: the Arrhenius-exponential model and the Peck-Weibull model. Thus, we show that is possible to estimate the reliability of a product during its development with a small number of prototypes using accelerated life testing with the ability to repair when a failure occurs. This method allows us to improve the accuracy in the estimation of reliability parameters where the accuracy is linked to the number of failure times that are available. Nevertheless, these models assume "minimal repairing" such that any repair has no impact on the failure rate.
引用
收藏
页码：340 / 345
页数：6
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