Influence of plasmons on terahertz conductivity measurements -: art. no. 012101

被引：98

作者：

Nienhuys, HK ^{[1
]}

Sundström, V ^{[1
]}

机构：

[1] Lund Univ, Ctr Chem, Dept Chem Phys, S-22100 Lund, Sweden

来源：

APPLIED PHYSICS LETTERS | 2005年 / 87卷 / 01期

关键词：

D O I：

10.1063/1.1977213

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Time-domain terahertz spectroscopy allows measuring the complex conductivity spectrum of materials at frequencies on the order of 1 THz. Typically, terahertz (THz) studies produce conductivity spectra that are different from those predicted by the classical Drude model, especially in nanostructured materials. We claim that plasmon resonances in particles that are small compared to the THz wavelength cause these deviations. This is supported by measurements on photoexcited silicon, in bulk as well as in micron-sized particles. In the latter, the behavior is vastly different and strongly dependent on charge carrier concentration. (c) 2005 American Institute of Physics.

引用

页数：3

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