Ensuring Correctness of Analog Circuits in Presence of Noise and Process Variations Using Pattern Matching

This paper relies on the longest closest subsequence (LCSS), a variant of the longest common subsequence (LCS), to account for noise and process variations inherited by analog circuits. The idea is to use stochastic differential equations (SDE) to model the design and integrate device variation due to the 0.18 mu m fabrication process in a MATLAB simulation environment. LCSS is used to find the longest and closest subsequence that matches with the subsequence of an ideal circuit. We illustrate the proposed approach on a Colpitts oscillator circuit. Advantages of the proposed methods are robustness and flexibility to account for wide range of variations.