Field emission from diamond coated tungsten tips

被引：13
|
作者：
Tondare, VN [1 ]
Pradeep, N [1 ]
Bambaladi, DD [1 ]
Godbole, VP [1 ]
Joag, DS [1 ]
机构：
[1] Univ Poona, Dept Phys, Ctr Adv Studies Solid State Phys & Mat Sci, Pune 411007, Maharashtra, India
来源：
SOLID-STATE ELECTRONICS | 2001年 / 45卷 / 06期
关键词：
field emission; diamond on tungsten; current stability; noise analysis;
D O I：
10.1016/S0038-1101(00)00207-0
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Field emission (FE) properties of diamond coated tungsten tips have been studied using a glass FE microscope. Diamond film was deposited on a tungsten field emitter by hot filament chemical vapour deposition method. Stable emission was found to occur from discrete locations as seen from the FE patterns. FE current-voltage (I-V) characteristics at 300 and 78 K have been studied. The difference in I-V characteristics at 300 and 78 K has been attributed to the reduction in conductivity at 78 K. The emission current is found remarkably stable over a long period of more than 3 h. Spectral analysis of the FE current shows noise proportional to 1/f(0.35), f being the frequency. The overall behaviour of the diamond coated tungsten emitter is consistent with the subband model of electron emission from semiconducting diamond. (C) 2001 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：957 / 962
页数：6
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