Digital image correlation-based analysis of strain accumulation on a duplex γ-TiAl

被引：14
|
作者：
Patriarca, L. [1 ]
Filippini, M. [1 ]
Beretta, S. [1 ]
机构：
[1] Politecn Milan, Dept Mech Engn, Via La Masa 1, I-20156 Milan, Italy
来源：
INTERMETALLICS | 2016年 / 75卷
关键词：
Titanium aluminides; Based on TiAl; Digital image correlation; Strain tensor; TITANIUM ALUMINIDE ALLOY; PLASTIC-DEFORMATION; GRAIN-BOUNDARIES; FATIGUE; POLYCRYSTALS; NUCLEATION; STRESSES; PST;
D O I：
10.1016/j.intermet.2016.05.013
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
This paper discusses the experimental results obtained for a duplex gamma-TiAl alloy deformed at room temperature. High resolution digital image correlation was used to measure local strain fields. The characterization of the microstructure was performed using optical microscopy and a precise correlation between the strain fields and the microstructure was found. High local strains were measured along well-oriented lamellar grains, in particular for the gamma-phase. Furthermore, the analysis of the two-dimensional strain tensor shows that the largest strain component is the shear strain in the plane of the lamellar grains. This study aims to provide further understanding of the deformation behavior of gamma-TiAl alloys. (C) 2016 Elsevier Ltd. All rights reserved.
引用
收藏
页码：42 / 50
页数：9
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