Estimation of the thickness of overlapping materials by using neural networks

被引:0
|
作者
Reen, N [1 ]
Tansel, IN [1 ]
Chen, P [1 ]
Wang, X [1 ]
Inanc, F [1 ]
Kropas-Hughes, C [1 ]
机构
[1] Florida Int Univ, Miami, FL 33174 USA
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中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
Backpropagation type artificial neural networks (ANN) were used to estimate the thickness of two overlapping materials by inspecting two X-ray images obtained at different X-ray tube voltage settings. Radiographic images of overlapping aluminum and brass wedges were simulated by using the X-ray radiography simulation program XRSIM. Simulated images were used for training and testing of the ANNs. The average estimation error was less than 4% and 7% on the training and test data respectively.
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收藏
页码:671 / 677
页数:7
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