THz Non-Destructive Testing for Covered Defects

被引：0

作者：

Panahi, Omid ^{[1
]}

Yahyaei, Bahareh ^{[2
]}

Kouhanestani, Mehrdad Kheyrollahi ^{[3
]}

Mousavi, Mahdi ^{[4
]}

机构：

[1] Shahid Beheshti Univ, Laser Plasma Res Inst, Tehran, Iran

[2] Bu Ali Univ, Dept Phys Chem, Fac Chem, Hamadan, Iran

[3] Sharif Univ Technol, Dept Phys, Tehran, Iran

[4] Shiraz Univ, Dept Phys, Fac Sci, Shiraz, Iran

来源：

2016 FOURTH INTERNATIONAL CONFERENCE ON MILLIMETER-WAVE AND TERAHERTZ TECHNOLOGIES (MMWATT) | 2016年

关键词：

THz imaging; Defect; Ray transfer matrix; Photoconductive antenna; TERAHERTZ; SPECTROSCOPY; TECHNOLOGY;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a pulsed THz imaging system in normal geometry is presented experimentally and the effect of placing a pinhole in front of a covered sample on image quality has been investigated too. Also, the improvement of image quality by using ray transfer matrix is described theoretically. Finally, by using contour system the results are evaluated and the accuracy of THz imaging system is tested.

引用

页码：45 / 47

页数：3

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