Low uncertainty broadband EMC measurement using calculable precision biconical antennas

被引:0
|
作者
Chen, Z [1 ]
Cook, A [1 ]
机构
[1] EMC Test Syst, Austin, TX 78758 USA
关键词
site attenuation; normalized site attenuation; biconical antennas; network; standard site method;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
It has been extensively studied and reported that uncertainties as low as 0.11 dB for antenna factor (AF) characterization can be achieved using FitzGerrell dipole antennas. Although it has been suggested to use these dipoles for swept frequency measurements, broadband biconical antennas have not been investigated and reported in literature in a similar manner. A pair of precision biconical antennas was constructed to investigate this possibility. The antennas were numerically simulated in the frequency range of 30-300 MHz; above an infinite conducting ground plane and in free space. The numerical results were combined with the measured S-parameters of the baluns to give the theoretical site attenuation. It has been shown that the standard site method adopted by ANSI C63.4 can have systematic errors In normalized site attenuation larger than 4 dB using free-space biconical AFs from 30 to 300 MHz. The numerical approach described in this paper is shown to be capable of providing theoretical sits attenuation values that are within a fraction of a dB of measured results.
引用
收藏
页码:505 / 510
页数:6
相关论文
共 46 条
  • [1] Imperfections in the theoretical NSA model can adversely or favorably affect a site validation measurement and a proposal for correction factors for broadband biconical antennas
    Windler, MJ
    Chen, Z
    [J]. 2000 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2, SYMPOSIUM RECORD, 2000, : 493 - 498
  • [2] Better measurement uncertainty using fully digital receivers in EMC emission tests
    Festa, Domenico
    Grego, Roberto
    Zingarelli, Michele
    [J]. 2008 ASIA-PACIFIC SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY AND 19TH INTERNATIONAL ZURICH SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, VOLS 1 AND 2, 2008, : 299 - +
  • [3] Low-Profile Broadband Antennas Using Metamaterial-Mushroom Structures
    Liu, Wei
    Chen, Zhi Ning
    Qing, Xianming
    [J]. 2015 IEEE INTERNATIONAL CONFERENCE ON COMPUTATIONAL ELECTROMAGNETICS (ICCEM), 2015, : 33 - 34
  • [4] Reduced measurement uncertainty in the frequency range 500 MHz to 1 GHz using a calculable standard dipole antenna.
    Loader, BG
    Alexander, MJ
    Salter, MJ
    [J]. INTERNATIONAL CONFERENCE ON ELECTROMAGNETIC COMPATIBILITY, 1997, (445): : 175 - 180
  • [5] Uncertainty Analysis in the Field Measurement using different Microstrip Patch Antennas in the Laboratory Environment
    Srivastava, Amit Kumar
    Ghosh, Saswati
    Bhattacharya, Amitabha
    Sarkar, Binay Kumar
    [J]. 2013 STUDENTS CONFERENCE ON ENGINEERING AND SYSTEMS (SCES): INSPIRING ENGINEERING AND SYSTEMS FOR SUSTAINABLE DEVELOPMENT, 2013,
  • [6] Covert and Broadband Direction Finding using Low-Profile Slot Spiral Antennas
    Jackson, Brad R.
    [J]. 2016 USNC-URSI RADIO SCIENCE MEETING (JOINT WITH AP-S SYMPOSIUM), 2016, : 69 - 70
  • [7] Uncertainty Analysis on Precision Measurement for Polystyrene Nanospheres Using Dynamic Light Scattering
    Pan, Shan-Peng
    Weng, Han-Fu
    Lin, Chih-Min
    Liu, Tzong-Shi
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, 49 (06) : 06GK051 - 06GK055
  • [8] Evaluation of Measurement Uncertainty of Radiated EMC Tests in Arbitrary Field Generators using Surface Currents on DUT
    Schrader, T.
    Muenter, K.
    Spitzer, M.
    Eulig, N.
    Enders, A.
    [J]. ADVANCES IN RADIO SCIENCE, 2005, 3 : 105 - 109
  • [9] Estimation of non-statistical uncertainty in precision measurement using grey system theory
    Gao, Y
    Wang, Z
    Tao, Z
    Lo, C
    [J]. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2003, 22 (3-4): : 271 - 277
  • [10] Estimation of non-statistical uncertainty in precision measurement using grey system theory
    Y. Gao
    Z. Wang
    Z. Tao
    C. Lo
    [J]. The International Journal of Advanced Manufacturing Technology, 2003, 22 : 271 - 277