Software Test Case Generation Based on the Fault Propagation Path Coverage

被引:0
|
作者
Wang Kun [1 ]
Wang Yichen [1 ]
机构
[1] Beihang Univ, Sci & Technol Reliabil & Environm Engn Lab, Beijing 100191, Peoples R China
关键词
correlated defects; fault injection; seed-defect; fault propagation path; path coverage; intelligent algorithm;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In the process of software testing, correlated defects raise researchers' attention worldwide. Some potential defects are hard to be detected in the test. To address these potential defects, this paper adopts an error propagation model to describe the process of defect evolution and applies fault injection method to introduce known seed-defects. Subsequently, seed-defects are activated and related potential defects are induced through test case design. This method employs intelligent algorithms to constantly design test cases to cover paths of seed-defects and paths of propagation. As a result, more undetected and correlated defects can be detected in paths of propagation.
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页数:4
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