Preliminary Experiments on Fault-Tolerance of a Small Convolutional Neural Network

被引：0
|
作者：
Kaneko, Haruhiko [1 ]
机构：
[1] Tokyo Inst Technol, Sch Comp, Tokyo, Japan
来源：
2018 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS-TAIWAN (ICCE-TW) | 2018年
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D O I：
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中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Fault-tolerance is an important property of safety critical systems, and there exist many established fault-tolerant technologies for conventional computing devices. As preliminary for fault-tolerant design of complex neural networks, this paper presents some simulation results of fault-tolerance of a small convolutional neural network for digit classification, and we show relations between error probability of synaptic weights and classification accuracy.
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页数：2
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