Automated fabric defect detection-A review

被引:433
|
作者
Ngan, Henry Y. T. [1 ]
Pang, Grantham K. H. [1 ]
Yung, Nelson H. C. [2 ]
机构
[1] Univ Hong Kong, Dept Elect & Elect Engn, Ind Automat Res Lab, Hong Kong, Hong Kong, Peoples R China
[2] Univ Hong Kong, Dept Elect & Elect Engn, Lab Intelligent Transportat Syst Res, Hong Kong, Hong Kong, Peoples R China
关键词
Fabric defect detection; Textile; Motif-based; Automation; Quality control; Manufacturing; SURFACE INSPECTION; NEURAL-NETWORK; PATTERN-RECOGNITION; WAVELET RECONSTRUCTION; MACHINE VISION; GABOR FILTERS; FOURIER; SYSTEM; CLASSIFICATION; REGULARITY;
D O I
10.1016/j.imavis.2011.02.002
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper provides a review of automated fabric defect detection methods developed in recent years. Fabric defect detection, as a popular topic in automation, is a necessary and essential step of quality control in the textile manufacturing industry. In categorizing these methods broadly, a major group is regarded as non-motif-based while a minor group is treated as motif-based. Non-motif-based approaches are conventional, whereas the motif-based approach is novel in utilizing motif as a basic manipulation unit. Compared with previously published review papers on fabric inspection, this paper firstly offers an up-to-date survey of different defect detection methods and describes their characteristics, strengths and weaknesses. Secondly, it employs a wider classification of methods and divides them into seven approaches (statistical, spectral, model-based, learning, structural, hybrid, and motif-based) and performs a comparative study across these methods. Thirdly, it also presents a qualitative analysis accompanied by results, including detection success rate for every method it has reviewed. Lastly, insights, synergy and future research directions are discussed. This paper shall benefit researchers and practitioners alike in image processing and computer vision fields in understanding the characteristics of the different defect detection approaches. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:442 / 458
页数:17
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