Iron solubility in highly boron-doped silicon

被引:65
|
作者
McHugo, SA [1 ]
McDonald, RJ
Smith, AR
Hurley, DL
Weber, ER
机构
[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA
[2] Univ Calif Berkeley, Dept Mat Sci, Berkeley, CA 94720 USA
关键词
D O I
10.1063/1.121964
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have directly measured the solubility of iron in high and low boron-doped silicon using instrumental neutron activation analysis. Iron solubilities were measured at 800, 900, 1000, and 1100 degrees C in silicon doped with either 1.5 x 10(19) or 6.5 x 10(14) boron atoms/cm(3). We have measured a greater iron solubility in high boron-doped silicon as compared to low boron-doped silicon, however, the degree of enhancement is lower than anticipated at temperatures >800 degrees C. The decreased enhancement is explained by a shift in the iron donor energy level towards the valence band at elevated temperatures. Based on this data, we have calculated the position of the iron donor level in the silicon band gap at elevated temperatures. We incorporate the iron energy level shift in calculations of iron solubility in silicon over a wide range of temperatures and boron-doping levels, providing a means to accurately predict iron segregation between high and low boron-doped silicon. (C) 1998 American Institute of Physics. [S0003-6951(98)01936-6].
引用
收藏
页码:1424 / 1426
页数:3
相关论文
共 50 条
  • [1] Precipitation of boron in highly boron-doped silicon
    Mizushima, I
    Mitani, Y
    Koike, M
    Yoshiki, M
    Tomita, M
    Kambayashi, S
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (3B): : 1171 - 1173
  • [2] The mechanism of iron gettering in boron-doped silicon
    Stolk, PA
    Benton, JL
    Eaglesham, DJ
    Jacobson, DC
    Cheng, JY
    Poate, JM
    Myers, SM
    Haynes, TE
    [J]. APPLIED PHYSICS LETTERS, 1996, 68 (01) : 51 - 53
  • [3] Anomalous solubility of implanted nitrogen in heavily boron-doped silicon
    D. I. Tetelbaum
    E. I. Zorin
    N. V. Lisenkova
    [J]. Semiconductors, 2004, 38 : 775 - 777
  • [4] Anomalous solubility of implanted nitrogen in heavily boron-doped silicon
    Tetelbaum, DI
    Zorin, EI
    Lisenkova, NV
    [J]. SEMICONDUCTORS, 2004, 38 (07) : 775 - 777
  • [5] INFLUENCE OF HOLES AND ELECTRONS ON THE SOLUBILITY OF LITHIUM IN BORON-DOPED SILICON
    REISS, H
    FULLER, CS
    [J]. TRANSACTIONS OF THE AMERICAN INSTITUTE OF MINING AND METALLURGICAL ENGINEERS, 1956, 206 (02): : 276 - 282
  • [6] Dynamic characteristics of dislocations in highly boron-doped silicon
    Yonenaga, I
    Taishi, T
    Huang, X
    Hoshikawa, K
    [J]. JOURNAL OF APPLIED PHYSICS, 2001, 89 (10) : 5788 - 5790
  • [7] Dynamic characteristics of dislocations in highly boron-doped silicon
    [J]. 1600, American Institute of Physics Inc. (89):
  • [8] Effects of electric field on polysilicon gettering of iron and copper in highly boron-doped silicon
    Koh, Song-Foo
    Yap, Seong-Shan
    Tou, Teck-Yong
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2018, 36 (03):
  • [10] ANNEALING AND PROFILE OF INTERSTITIAL IRON IN BORON-DOPED SILICON
    GAO, X
    MOLLENKOPF, H
    YEE, S
    [J]. APPLIED PHYSICS LETTERS, 1991, 59 (17) : 2133 - 2135