Long-term stability of the Wechsler intelligence scale for Children - Third edition

被引:93
|
作者
Canivez, GL
Watkins, MW
机构
[1] Eastern Illinois Univ, Dept Psychol, Charleston, IL 61920 USA
[2] Penn State Univ, Dept Educ, University Pk, PA 16802 USA
[3] Penn State Univ, Sch Psychol & Special Educ, University Pk, PA 16802 USA
关键词
D O I
10.1037/1040-3590.10.3.285
中图分类号
B849 [应用心理学];
学科分类号
040203 ;
摘要
Long-term stability of the Wechsler Intelligence Scale for Children-Third Edition (WISC-III; D. Wechsler, 1991) was investigated with a sample of 667 students from 33 states twice evaluated for special education consideration. With an average test-retest interval of 2.87 years, test-retest reliability coefficients for the Verbal IQ, Performance IQ, and Full Scale IQ were .87, .87, and .91, respectively (p < .0001). As expected, test-retest reliability coefficients for the subtests were generally lower than for global IQ and factor index scores. Mean differences from first testing to second testing were either not statistically significant or not clinically meaningful. Results provided the highest estimates of long-term stability for the WISC-III yet reported.
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页码:285 / 291
页数:7
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