High-resolution three-dimensional imaging using multiple nanometric probes

被引:0
|
作者
Dubois, A [1 ]
Moneron, G [1 ]
Lecaque, R [1 ]
Lequeux, F [1 ]
Boccara, AC [1 ]
机构
[1] Ecole Super Phys & Chim Ind Ville Paris, CNRS, UPR A0005, Lab Opt Phys, F-75231 Paris 5, France
关键词
interference microscopy; three-dimensional microscopy; scanning probe microscopy;
D O I
10.1117/12.477973
中图分类号
TH742 [显微镜];
学科分类号
摘要
We present a new imaging modality using nanometric beads as multiple local probes. The positions of the beads are determined in three dimensions using white-light interference microscopy, by over-sampling and fitting the images. We measured the deformation of a Laponite gel with 100 nm resolution.
引用
收藏
页码:50 / 58
页数:9
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