Hysteresis-type current-voltage characteristics in Au/eumelanin/ITO/glass structure: Towards melanin based memory devices

被引:57
|
作者
Ambrico, Marianna [1 ]
Cardone, Antonio [2 ]
Ligonzo, Teresa [3 ]
Augelli, Vincenzo [3 ]
Ambrico, Paolo Francesco [1 ]
Cicco, Stefania [2 ]
Farinola, Gianluca M. [4 ]
Filannino, Michele [3 ]
Perna, Giuseppe [5 ]
Capozzi, Vito [5 ]
机构
[1] CNR UOS Bari, Inst Inorgan Methodol & Plasmas IMIP, I-70126 Bari, Italy
[2] CNR ICCOM UOS Bari, I-70126 Bari, Italy
[3] Univ Bari, Dipartimento Interateneo Fis, I-70126 Bari, Italy
[4] Univ Bari, Dipartmento Chim, I-70126 Bari, Italy
[5] Univ Foggia, Dept Biomed Sci, I-71100 Foggia, Italy
关键词
Eumelanin layer; Hysteresis effect; Memory device; OPTICAL-ABSORPTION; EUMELANIN; FILMS; SIMULATION; CHARGES; POLYMER; MODELS;
D O I
10.1016/j.orgel.2010.08.001
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Hysteresis behaviour of the current-voltage characteristics collected on spin coated synthetic eumelanin layer embedded in the Au/eumelanin/ITO/glass structure is shown. The effect has been observed under dark both in air and vacuum environment and its magnitude has been found related to the eumelanin hydration state. Moreover, in vacuum and under white light illumination, enhancement of the hysteresis loop area respect to those collected under dark has been observed. Space charge storage and charge trapping/detrapping as possible mechanisms responsible of the observed current-voltage behaviour are discussed. Preliminary experimental results have evidenced the possible integration of eumelanin layers in electro-optical charge storage based memory devices. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:1809 / 1814
页数:6
相关论文
共 50 条
  • [1] Incorporation of polyvinyl alcohol into ZrO2 to modulate the hysteresis-type current-voltage characteristics of Au/ZrO2/heavily doped p-type Si devices
    Yu, J-F
    Lin, Y-J
    Lin, M-H
    Chang, H-C
    INDIAN JOURNAL OF PHYSICS, 2021, 95 (05) : 865 - 870
  • [2] Current-voltage characteristics of Au/GaN/GaAs structure
    Ebeoglu, Mehmet Ali
    PHYSICA B-CONDENSED MATTER, 2008, 403 (01) : 61 - 66
  • [3] Hysteresis-type current-voltage characteristics of indium tin oxide/poly (3,4-ethylenedioxythiophene) doped with poly (4-styrenesulfonate)/indium tin oxide devices
    Lin, Yow-Jon
    JOURNAL OF APPLIED PHYSICS, 2008, 103 (06)
  • [4] CURRENT-VOLTAGE CHARACTERISTICS INCLUDING BREAKDOWN VOLTAGE FOR AU/ZNO/AU/FUSED QUARTZ STRUCTURE
    KUSHIDA, K
    TAKEUCHI, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (05): : 630 - 631
  • [5] Incorporation of polyvinyl alcohol into ZrO2 to modulate the hysteresis-type current–voltage characteristics of Au/ZrO2/heavily doped p-type Si devices
    Jen-Fu Yu
    Yow-Jon Lin
    Meng-Hsun Lin
    Hsing-Cheng Chang
    Indian Journal of Physics, 2021, 95 : 865 - 870
  • [6] Anomalous current-voltage characteristics in Al/lead phthalocyanine/Au structure
    Kumazawa, Kinya
    Yamanaka, Mitsugu
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 1991, 30 (03): : 530 - 531
  • [7] ANOMALOUS CURRENT-VOLTAGE CHARACTERISTICS IN AL/LEAD PHTHALOCYANINE/AU STRUCTURE
    KUMAZAWA, K
    YAMANAKA, M
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (03): : 530 - 531
  • [8] On the mechanism of the hysteresis and offset of current-voltage characteristics of diodes based on organic materials
    Thurzo, I
    Pham, G
    Zahn, DRT
    CHEMICAL PHYSICS, 2003, 287 (1-2) : 43 - 54
  • [9] Hysteresis effect in current-voltage characteristics of Ni/n-type 4H-SiC Schottky structure
    Yuan, Hao
    Song, Qing-Wen
    Han, Chao
    Tang, Xiao-Yan
    He, Xiao-Ning
    Zhang, Yu-Ming
    Zhang, Yi-Men
    CHINESE PHYSICS B, 2019, 28 (11)
  • [10] Non-Zero and Open-Loop Current-Voltage Characteristics in Electronic Memory Devices
    Paul, Febin
    Manjunatha, Krishna Nama
    Paul, Shashi
    ADVANCED ELECTRONIC MATERIALS, 2023, 9 (10):