共 42 条
- [2] Distribution of Bit Patterns on Multi-value Sequence over Odd Characteristics Field [J]. 2017 IEEE INTERNATIONAL CONFERENCE ON CONSUMER ELECTRONICS - TAIWAN (ICCE-TW), 2017,
- [3] Distribution of Digit Patterns in Multi-Value Sequence over the Odd Characteristic Field [J]. IEICE TRANSACTIONS ON FUNDAMENTALS OF ELECTRONICS COMMUNICATIONS AND COMPUTER SCIENCES, 2018, E101A (09): : 1525 - 1536
- [4] ROBUST ESTIMATE OF A LOCATION PARAMETER FOR ONE CLASS OF CONTAMINATED DISTRIBUTION [J]. VESTNIK MOSKOVSKOGO UNIVERSITETA SERIYA 1 MATEMATIKA MEKHANIKA, 1980, (06): : 39 - 43
- [5] A SHRINKAGE TESTIMATOR FOR THE SCALE PARAMETER OF THE EXPONENTIAL-DISTRIBUTION IN CENSORED SAMPLING [J]. NATIONAL ACADEMY SCIENCE LETTERS-INDIA, 1987, 10 (03): : 101 - 103
- [6] Revisiting the basic issue of parameter estimation in system identification - a new approach for multi-value estimation [J]. 47TH IEEE CONFERENCE ON DECISION AND CONTROL, 2008 (CDC 2008), 2008, : 1956 - 1961
- [7] Comparative study on parameter estimate method for extremal value distribution [J]. Harbin Gongye Daxue Xuebao/Journal of Harbin Institute of Technology, 2004, 36 (12): : 1605 - 1609
- [10] Estimation of a parameter of Morgenstern type bivariate exponential distribution by ranked set sampling [J]. Annals of the Institute of Statistical Mathematics, 2008, 60 : 301 - 318