Measurement of the Optical Constants of Thin Metal Films by THz Differential Time Domain Spectroscopy

被引：8
|
作者：
Ma Feng-Ying [1 ]
Su Jian-Po [1 ]
Gong Qiao-Xia [1 ]
Yang Jing [1 ]
Du Yan-Li [1 ]
Guo Mao-Tian [1 ]
Yuan Bin [1 ]
机构：
[1] Zhengzhou Univ, Sch Phys Sci & Engn, Zhengzhou 450001, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2011年 / 28卷 / 09期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1088/0256-307X/28/9/097803
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
Three kinds of nanometer-scale metal films (Cr, Ni and Ti) with different thicknesses are fabricated. The complex refractive indices of the three metal films are quantitatively measured by using THz differential time-domain spectroscopy (THz-DTDS). The orders of the complex refractive indices of the thin metal films are equal to those of the reported values. Our results validated that THz-DTDS can be used to study the features of the ultra-thin metal films.
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页数：4
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