Control chart pattern recognition using semi-supervised learning

被引：0

作者：

Yang, Miin-Shen ^{[1
]}

Yang, Jenn-Hwai ^{[1
]}

机构：

[1] Chung Yuan Christian Univ, Dept Appl Math, Chungli 32023, Taiwan

来源：

PROCEEDINGS OF THE 7TH WSEAS INTERNATIONAL CONFERENCE ON APPLIED COMPUTER SCIENCE: COMPUTER SCIENCE CHALLENGES | 2007年

关键词：

control chart; pattern recognition; semi-supervised learning; labeled pattern; recognition rate;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

This paper presents a semi-supervised learning algorithm for a control chart pattern recognition system. A learning neural network is trained with labeled control chart patterns based on unsupervised learning. We then use the classification method based on a statistical correlation coefficient approach to test patterns. We find that the proposed semi-supervised learning algorithm is effective according to numerical comparisons.

引用

页码：272 / +

页数：3

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