Improving Metrological Reliability of Information-Measuring Systems Using Mathematical Modeling of Their Metrological Characteristics

被引：0

作者：

Kurnosov, R. Yu ^{[1
]}

Chernyshova, T. I. ^{[1
]}

Chernyshov, V. N. ^{[1
]}

机构：

[1] Tambov State Tech Univ, 106 Sovetskaya St, Tambov 392000, Russia

来源：

INTERNATIONAL CONFERENCE INFORMATION TECHNOLOGIES IN BUSINESS AND INDUSTRY 2018, PTS 1-4 | 2018年 / 1015卷

关键词：

D O I：

10.1088/1742-6596/1015/3/032077

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The algorithms for improving the metrological reliability of analogue blocks of measuring channels and information-measuring systems are developed. The proposed algorithms ensure the optimum values of their metrological reliability indices for a given analogue circuit block solution.

引用

页数：6

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