Semiconductor Laser Beam Quality Metrics for Free-Space Optical Communications

被引：0

作者：

Beil, James ^{[1
]}

Swertfeger, Rebecca ^{[1
]}

Misak, Stephen ^{[1
]}

Gao, Zihe ^{[2
]}

Choquette, Kent D. ^{[2
]}

Leisher, Paul O. ^{[1
]}

机构：

[1] Rose Hulman Inst Technol, 5500 Wabash Ave, Terre Haute, IN 47803 USA

[2] Univ Illinois, Kirby Ave, Champaign, IL USA

来源：

PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PHOTONICS, OPTICS AND LASER TECHNOLOGY (PHOTOPTICS) | 2017年

关键词：

Beam Quality; Beam Propagation Factor; Beam Parameter Product; Diffraction-Limited; Gaussian; near-Field; Far-Field; Beam Waist; Divergence Angle; Free-Space Optical Communications; Semiconductor Laser; Diode Laser; Beam Metrics;

D O I：

10.5220/0006122601960201

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The beam propagation factor, M-2, exists as one of very few measures of a laser's performance, when really a more detailed analysis of the application and laser are necessary for judgement in most cases. In free-space optical communications, a crucial figure of merit is the proportion of diffraction-limited power in the far-field. A calculated structure has been made with a higher proportion of diffraction-limited power in the farfield than another calculated structure with a much better M-2. This calculated structure has an M-2 of 19, with 89% of its power within the diffraction limit in the far-field, compared to another calculated structure with M-2 of 1.7 that has 86% of its power within the diffraction limit in the far-field.

引用

页码：196 / 201

页数：6

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