Evaluation of attenuated PSM photomask blanks with TF11 chrome and FEP-171 resist on a 248 nm DUV laser pattern generator

被引:0
|
作者
Xing, Kezhao [1 ]
Bjornborg, Charles [1 ]
Karlsson, Henrik [1 ]
Paulsson, Adisa [1 ]
Rosendahl, Anna [1 ]
Beiming, Peter [1 ]
Vedenpaa, Jukka [1 ]
Walford, Jonathan [1 ]
Newman, Tom [1 ]
机构
[1] Micron Laser Syst AB, S-18303 Taby, Sweden
来源
关键词
TF11; FEP-171; DUV laser; sigma7500; photomask; laser pattern generator;
D O I
10.1117/12.746855
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Tighter requirements on mask resolution, CD and image positioning accuracy at and beyond the 45 nm technology node push the development of improved photomask blanks. One such blank for attenuated phase-shift masks (att-PSM) provides a thinner chrome film, named TF11, with higher chrome etch rate compared to the previous generation Att-PSM blank (NTAR5 chrome film) from the same supplier. Reduced stress in the chrome film also results in less image placement error induced by the material. FEP-171 is the positive chemically amplified resist (PCAR) that is most commonly used in advanced mask manufacturing with both 50 keV variable shaped e-beam (VSB) and DUV laser pattern generators. TF11 allows an FEP-171 resist film down to about 2000 angstrom thickness with sufficient etch resistance, while the standard resist thickness for NTAR5 is around 3000 angstrom. This work has experimentally evaluated the use of TF11 chrome and FEP-171 resist together with a 248 nm DUV laser pattern generator, the Sigma7500. First, patterning performance in resist with thicknesses from 2000 angstrom to 2600 angstrom, in steps of 100 angstrom, was tested with respect to swing curve and basic lithographic parameters including resolution, CD linearity, CD iso-dense bias and dose sensitivity. Patterning results on mask showed a swing minimum at around 2200 angstrom and a swing maximum at around 2500 angstrom, which correspond to reflectivity measurements for 248 nm wavelength performed by the blank supplier. It was concluded that the overall patterning performance was best close to the swing maximum. Thereafter the patterning performance using TF11 at two resist thicknesses, 2000 angstrom and 2550 angstrom, was studied in more detail and compared to performance using NTAR5 with 3200 angstrom resist. The evaluation showed that the Sigma7500-II offers good compatibility with TF11, especially using the optimized FEP-171 resist thickness of 2550 angstrom. it also showed that the patterning capability of the Sigina.7500-II using TF11 and 2550 angstrom resist is improved compared to using NTAR5 and 3200 angstrom resist.
引用
收藏
页码:Z7303 / Z7303
页数:8
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  • [2] FEP-171 resist thickness optimization and dry etch screening on NTAR7 chrome substrates for sigma7300 DUV laser pattern generator
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    Kjellberg, L
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    Dahlberg, A
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    24TH ANNUAL BACUS SYMPOSIUM ON PHOTOMASK TECHNOLOGY, PT 1 AND 2, 2004, 5567 : 234 - 244