Effect of Sn4+ substitution on microwave dielectric properties of (Mg0.95Ni0.05)(Ti1-xSnx)O3 ceramics

被引：14
|
作者：
Jo, Hyun Jin [1 ]
Kim, Eung Soo [1 ]
机构：
[1] Kyonggi Univ, Dept Mat Engn, Suwon 443760, South Korea
来源：
MATERIALS RESEARCH BULLETIN | 2015年 / 67卷
基金：
新加坡国家研究基金会;
关键词：
Ceramics; Microstructure; Raman spectroscopy; X-ray diffraction; Dielectric properties; BOND-VALENCE PARAMETERS; POWDER DIFFRACTION; CRYSTAL-STRUCTURES; SOLID-SOLUTIONS; ILMENITE;
D O I：
10.1016/j.materresbull.2014.07.041
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The effects of the substitution of Sn4+ at Ti4+ sites on the structural characteristics and microwave dielectric properties of (Mg0.95Ni0.05)(Ti1-xSnx)O-3 (MNTS, 0 <= x <= 0.25) ceramics were investigated. Single-phase ilmenite was confirmed up to x = 0.15, and then SnO2 was observed as secondary phase upon further substitution. For the single-phase specimens, the unit-cell volume increased with Sn4+ substitution due to the larger ionic radius of Sn4+ than TO4+. The quality factor of the MNTS specimens depended on their B-site bond valence. The dielectric constants of the specimens decreased with increasing Sn4+ substitution due to the lower polarizability of Sn4+ compared to Ti4+. The temperature coefficient of the resonant frequency of the specimens decreased with Sn4+ substitution, which could be attributed to the associated decrease in the tolerance factor of the specimens. The relationship between the microstructure and the microwave dielectric properties were also investigated. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码：221 / 225
页数：5
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