Effects of addition of Al on electrical degradation of ZnO varistors

被引:1
|
作者
Satoi, Y [1 ]
Yoshikado, S [1 ]
机构
[1] Doshisha Univ, Dept Elect, Kyotanabe 6100321, Japan
来源
关键词
ZnO varistors; Al addition; electrical degradation; ICTS method; valence state;
D O I
10.4028/www.scientific.net/KEM.248.99
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Effects of addition of Al on the electrical degradation of the Bi, Mn, and Al added ZnO varistors and the Bi, Co, and Al added ZnO varistors were investigated by V-I, C-V, and ICTS methods. From V-I method, it is found that the optimum quantity of Al additive to prevent the electrical degradation is approximately 3ppm in the case of Bi-Mn-Al added ZnO varistor and approximately 13ppm in the case of Bi-Co-Al added ZnO varistor. The degree of the electrical degradation of Bi-Co-Al added ZnO varistors was smaller than that of Bi-Mn-Al added ZnO varistors for the optimum content of Al. The electrical degradation was hindered with increasing the depth of the trap levels. From the results of C-V method, it was found that, the height of phi(B) became lower for Bi-Mn-Al added ZnO varistors and became higher for Bi-Co-Al added ZnO varistors. The density N-is of the interface state shows the minimum value for the optimum content of Al for both Bi-Co added and Bi-Mn added ZnO varistors.
引用
收藏
页码:99 / 102
页数:4
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