General Optimality of the Heisenberg Limit for Quantum Metrology

被引:168
|
作者
Zwierz, Marcin [1 ]
Perez-Delgado, Carlos A. [1 ,2 ]
Kok, Pieter [1 ]
机构
[1] Univ Sheffield, Dept Phys & Astron, Sheffield S3 7RH, S Yorkshire, England
[2] Univ Sussex, Dept Phys & Astron, Brighton BN1 9QH, E Sussex, England
关键词
STATISTICAL DISTANCE; EVOLUTION;
D O I
10.1103/PhysRevLett.105.180402
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Quantum metrology promises improved sensitivity in parameter estimation over classical procedures. However, there is a debate over the question of how the sensitivity scales with the resources and the number of queries that are used in estimation procedures. Here, we reconcile the physical definition of the relevant resources used in parameter estimation with the information-theoretical scaling in terms of the query complexity of a quantum network. This leads to a completely general optimality proof of the Heisenberg limit for quantum metrology. We give an example of how our proof resolves paradoxes that suggest sensitivities beyond the Heisenberg limit, and we show that the Heisenberg limit is an information-theoretic interpretation of the Margolus-Levitin bound, rather than Heisenberg's uncertainty relation.
引用
收藏
页数:4
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