Surface contouring by diffractive optical element-based fringe projection

被引：2
|
作者：
Schirripa-Spagnolo, G
Ambrosini, D
机构：
[1] Univ Roma Tre, INFM, Dipartimento Ingn Elettron, I-00146 Rome, Italy
[2] Univ Aquila, INFM, Dipartimento Energet, I-67040 Laquila, Italy
来源：
MEASUREMENT SCIENCE AND TECHNOLOGY | 2001年 / 12卷 / 01期
关键词：
surface topography; electro-optics system; phase gratings; fringe projection; Fourier demodulation; profilometry; reverse engineering;
D O I：
10.1088/0957-0233/12/1/402
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
This design note describes an optoelectronic technique able to obtain the surface topography. The sensor is based on a new fringe projection system, which uses a phase diffraction grating. The proposed system is simple, compact, robust and easy to use.
引用
收藏
页码：N6 / N8
页数：3
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