Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials

被引:28
|
作者
Chen, Hanbing [1 ]
Qin, Zhenbo [2 ]
He, Meifeng [1 ]
Liu, Yichun [3 ]
Wu, Zhong [2 ]
机构
[1] Univ Shanghai Sci & Technol, Sch Mat Sci & Engn, Shanghai 200093, Peoples R China
[2] Tianjin Univ, Minist Educ, Key Lab Adv Ceram & Machining Technol, Tianjin 300072, Peoples R China
[3] Kunming Univ Sci & Technol, Sch Mat Sci & Engn, Kunming 650093, Yunnan, Peoples R China
基金
中国国家自然科学基金;
关键词
EC-AFM; corrosion; metallic materials; IN-SITU AFM; TORSIONAL RESONANCE MODE; LOCALIZED CORROSION; PITTING CORROSION; PIT INITIATION; CEO2; NANOPARTICLES; AQUEOUS CORROSION; STAINLESS-STEELS; SURFACE; COPPER;
D O I
10.3390/ma13030668
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a potentiostat makes it possible to observe the topographical changes of the sample surface in real time. EC-AFM is used in in situ corrosion research because the samples are not required to be electrically conductive. It is widely used in passive film properties, surface dissolution, early-stage corrosion initiation, inhibitor efficiency, and many other branches of corrosion science. This review provides the research progress of EC-AFM and summarizes the extensive applications and investigations using EC-AFM in corrosion science.
引用
收藏
页数:47
相关论文
共 50 条
  • [1] Use of in situ electrochemical atomic force microscopy (EC-AFM) to monitor cathode surface reaction in organic electrolyte
    Vidu, R
    Quinlan, FT
    Stroeve, P
    [J]. INDUSTRIAL & ENGINEERING CHEMISTRY RESEARCH, 2002, 41 (25) : 6546 - 6554
  • [2] In situ observation on Au(100) surface in molten EMImBF4 by electrochemical atomic force microscopy (EC-AFM)
    Kubo, K
    Hirai, N
    Tanaka, T
    Hara, S
    [J]. SURFACE SCIENCE, 2003, 546 (01) : L785 - L788
  • [3] The use of atomic force microscopy (AFM) in the study of electrochemical phenomena
    Vermesan, Horatiu
    Hirai, Nobumitsu
    [J]. Galvanotechnik, 2010, 101 (04): : 718 - 729
  • [4] Principle and application of atomic force microscopy (AFM) for nanoscale investigation of metal corrosion
    Shinato, Kebede W.
    Huang, Feifei
    Jin, Ying
    [J]. CORROSION REVIEWS, 2020, 38 (05) : 423 - 432
  • [5] Atomic force microscopy (AFM) application to diatom study: review and perspectives
    Ana T. Luís
    Daša Hlúbiková
    Véronique Vaché
    Patrick Choquet
    Lucien Hoffmann
    Luc Ector
    [J]. Journal of Applied Phycology, 2017, 29 : 2989 - 3001
  • [6] Atomic force microscopy (AFM) application to diatom study: review and perspectives
    Luis, Ana T.
    Hlubikova, Dasa
    Vache, Veronique
    Choquet, Patrick
    Hoffmann, Lucien
    Ector, Luc
    [J]. JOURNAL OF APPLIED PHYCOLOGY, 2017, 29 (06) : 2989 - 3001
  • [7] Application of electrochemical atomic force microscopy
    Li, XJ
    He, PG
    Fang, YX
    Hu, J
    Li, MQ
    [J]. CHINESE JOURNAL OF ANALYTICAL CHEMISTRY, 2004, 32 (03) : 395 - 401
  • [8] Application of atomic force microscopy in the study of microbiologically influenced corrosion
    Xu, LC
    Chan, KY
    Fang, HHP
    [J]. MATERIALS CHARACTERIZATION, 2002, 48 (2-3) : 195 - 203
  • [9] Atomic force microscopy (AFM)
    Sherma, J
    [J]. JOURNAL OF AOAC INTERNATIONAL, 2005, 88 (06) : 133A - 140A
  • [10] Atomic force microscopy laboratory on metallic surface corrosion.
    Augustine, BH
    Skolnik, AM
    Hughes, WC
    [J]. ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2000, 220 : U184 - U184