Local anisotropy in strained manganite thin films

被引：9
|
作者：
Souza-Neto, NM
Ramos, AY
Tolentino, HCN
Favre-Nicolin, E
Ranno, L
机构：
[1] LNLS, BR-13084971 Campinas, Brazil
[2] UNICAMP, Inst Fis Gleb Wataghin, BR-13083970 Campinas, Brazil
[3] LMCP, CNRS, UMR 7590, Paris, France
[4] Univ Grenoble 1, CNRS, UPR 5051, Lab Louis Neel, Grenoble, France
来源：
APPLIED PHYSICS LETTERS | 2003年 / 83卷 / 17期
关键词：
D O I：
10.1063/1.1623936
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We report on an angular resolved x-ray absorption spectroscopy study of the local atomic structure around the manganese ions in La0.7Sr0.3MnO3 thin films epitaxially grown on tensile and compressive substrates. Ab initio calculations provide strong support to the analysis of the experimental data and make possible the unambiguous derivation of a model of local distortion around the manganese atoms, without modification of the tilt angle Mn-O-Mn, among the octahedra. This distortion, tending to localize the charge carriers, is the driving parameter in the modifications of the magnetic and transport properties observed in thin films with respect to bulk systems. (C) 2003 American Institute of Physics.
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收藏
页码：3587 / 3589
页数：3
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