Dynamic evolution of the resistive wall mode with finite wall thickness

被引:2
|
作者
Chen, L. X. [1 ]
Ma, Z. W. [1 ,2 ]
机构
[1] Chinese Acad Sci, Inst Plasma Phys, Hefei 230031, Peoples R China
[2] Zhejiang Univ, Inst Fus Theory & Simulat, Hangzhou 310027, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
PLASMA ROTATION; STABILIZATION; TOKAMAKS; STABILITY; IDEAL; INSTABILITY;
D O I
10.1088/0031-8949/84/02/025504
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The effects of wall thickness on the resistive wall mode (RWM) are studied in a slab geometry with and without plasma flow. The wall thickness can have a large effect on both the linear growth rate and the nonlinear saturation level of the RWM for a low flow velocity. The effect of the wall thickness on the RWM becomes much weaker for a high flow velocity. We found that there is an optimum wall thickness that suppresses the linear growth rate. The plasma flow can also help to control the growth of the RWM. The optimum wall thickness is about delta similar to 0.04-0.07, and decreases with increasing plasma flow velocity, but is almost independent of the wall location. The effect of the plasma flow on the saturation level is much weaker than that of the wall thickness because the duration of the linear growth phase increases with increasing flow velocity. Finally, we find that the RWM is completely stabilized in the regime with a large wall thickness.
引用
收藏
页数:5
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