A device model for thin silicon-on-insulator SiGe heterojunction bipolar transistors with saturation effects

被引:2
|
作者
Xu Xiao-Bo [1 ]
Xu Kai-Xuan [1 ]
Zhang He-Ming [1 ]
Qin Shan-Shan [1 ]
机构
[1] Xidian Univ, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Peoples R China
关键词
saturation effect; heterojunction bipolar transistor; SiGe; silicon-on-insulator; FILM SOI;
D O I
10.1088/1674-1056/20/9/098501
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In this paper, we describe the saturation effect of a silicon germanium (SiGe) heterojunction bipolar transistor (HBT) fabricated on a thin silicon-on-insulator (SOI) with a step-by-step derivation of the model formulation. The collector injection width, the internal base-collector bias, and the hole density at the base-collector junction interface are analysed by considering the unique features of the internal and the external parts of the collector, as they are different from those of a bulk counterpart.
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页数:5
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