Bonded Multilayer Laue Lens for focusing hard X-rays

被引:6
|
作者
Liu, Chian
Conley, R.
Qian, J.
Kewish, C. M.
Macrander, A. T.
Maser, J.
Kang, H. C.
Yan, H.
Stephenson, G. B.
机构
[1] Argonne Natl Lab, X ray Sci Div, Argonne, IL 60439 USA
[2] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA
[3] Argonne Natl Lab, Mat Sci Div, Argonne, IL 60439 USA
[4] Kwangju Inst Sci & Technol, Adv Photon Res Inst, Kwangju 500712, South Korea
关键词
nanofocusing; Multilayer Laue Lens; multilayer; Au-Sn bonding;
D O I
10.1016/j.nima.2007.08.077
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We have fabricated partial Multilayer Laue Lens (MLL) linear zone plate structures with thousands of alternating WSi2 and Si layers and various outermost zone widths according to the Fresnel zone plate formula. Using partial MLL structures, we were able to focus hard X-rays to line foci with a width of 30 nm and below. Here, we describe challenges and approaches used to bond these multilayers to achieve line and point focusing. Bonding was done by coating two multilayers with AuSn and heating in a vacuum oven at 280-300 degrees C. X-ray reflectivity measurements confirmed that there was no change in the multilayers after heating to 350 degrees C. A bonded MLL was polished to a 5-25 mu m wedge without cracking. SEM image analyses found well-positioned multilayers after bonding. These results demonstrate the feasibility of a bonded full MLL for focusing hard X-rays. (C) 2007 Published by Elsevier B.V.
引用
收藏
页码:123 / 125
页数:3
相关论文
共 50 条
  • [1] Full Multilayer Laue Lens for Focusing Hard X-rays
    Liu, Chian
    Shi, B.
    Qian, J.
    Conley, R.
    Yan, H.
    Wieczorek, M.
    Macrander, A. T.
    Maser, J.
    Stephenson, G. B.
    [J]. SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION, 2010, 1234 : 47 - +
  • [2] Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens
    Kang, Hyon Chol
    Yan, Hanfei
    Winarski, Robert P.
    Holt, Martin V.
    Maser, Joerg
    Liu, Chian
    Conley, Ray
    Vogt, Stefan
    Macrander, Albert T.
    Stephenson, G. Brian
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (22)
  • [3] Multilayer Laue lens focuses hard x-rays
    不详
    [J]. LASER FOCUS WORLD, 2008, 44 (08): : 11 - 11
  • [4] Nanometer linear focusing of hard x rays by a multilayer Laue lens
    Kang, HC
    Maser, J
    Stephenson, GB
    Liu, C
    Conley, R
    Macrander, AT
    Vogt, S
    [J]. PHYSICAL REVIEW LETTERS, 2006, 96 (12)
  • [5] Normal-incidence multilayer Laue lens focuses hard x-rays
    不详
    [J]. LASER FOCUS WORLD, 2017, 53 (05): : 17 - 17
  • [6] Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays
    Shu, Deming
    Nazaretski, Evgeny
    Kim, Jungdae
    Yan, Hanfei
    Lauer, Kenneth
    Mullany, Brian
    Kuhne, Dennis
    Maser, Joerg
    Chu, Yong S.
    [J]. 11TH INTERNATIONAL CONFERENCE ON X-RAY MICROSCOPY (XRM2012), 2013, 463
  • [7] Influence of imperfections in a wedged multilayer Laue lens for the focusing of X-rays investigated by beam propagation method
    Andrejczuk, Andrzej
    Krzywinski, Jacek
    Bajt, Sasa
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2015, 364 : 60 - 64
  • [8] Feasibility study of a Laue lens for hard X-rays for space astronomy
    Pisa, A
    Frontera, F
    De Chiara, P
    Loffredo, G
    Pellicciotta, D
    Landini, G
    Franceschini, T
    Silvestri, S
    Andersen, K
    Courtois, P
    Hamelin, B
    [J]. ADVANCES IN COMPUTATIONAL METHODS FOR X-RAY AND NEUTRON OPTICS, 2004, 5536 : 39 - 48
  • [9] Laue lens development for hard X-rays (>60 keV)
    Pellicciotta, D
    Frontera, F
    Loffredo, G
    Pisa, A
    Andersen, K
    Courtois, P
    Hamelin, B
    Carassiti, V
    Melchiorri, M
    Squerzanti, S
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2006, 53 (01) : 253 - 258
  • [10] Effect of the Mismatch of Layer Thicknesses on the Focusing of X Rays by Multilayer Laue Lens
    Punegov, V. I.
    [J]. JETP LETTERS, 2020, 111 (07) : 376 - 382