TUGEN: An automatic test suite generator integrating data-flow and control-flow methods

被引：0
|
作者：
Wang, JG [1 ]
Hao, RB [1 ]
Wu, JP [1 ]
机构：
[1] Tsing Hua Univ, Dept Comp Sci, Beijing 100084, Peoples R China
来源：
ICC 98 - 1998 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATIONS VOLS 1-3 | 1998年
关键词：
protocol conformance testing; test suite; external behavior expression;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper presentes a new method and its implementation called TUGEN. This method integrates the features of data-flow and control-flow test. TUGEN is based on a formal model called EBE that specifies only the external behavior of a protocol. We introduce the UIO sequence algorithm to determine the state and the concept of AIO tree to solve the nondeteminism of a protocol. We also use the protocol constraint set to control the complexity of exploring space. Furthermore, we can optimally generate the test suite by simulant testing.
引用
收藏
页码：286 / 290
页数：5
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