Enhanced Performance of HgCdTe Long-Wavelength Infrared Photodetectors With nBn Design

被引:26
|
作者
He, Jiale [1 ]
Wang, Peng [1 ]
Li, Qing [1 ]
Wang, Fang [1 ]
Gu, Yue [1 ]
Shen, Chuan [2 ]
Chen, Lu [2 ]
Martyniuk, Piotr [3 ]
Rogalski, Antoni [3 ]
Chen, Xiaoshuang [1 ]
Lu, Wei [1 ]
Hu, Weida [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, State Key Lab Infrared Phys, Shanghai 200083, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Tech Phys, Key Lab Infrared Imaging Mat & Detectors, Shanghai 200083, Peoples R China
[3] Mil Univ Technol, Inst Appl Phys, PL-00908 Warsaw, Poland
基金
上海市自然科学基金; 中国国家自然科学基金;
关键词
Band-offset; dark current; HgCdTe; long-wavelength infrared (LWIR) photodetectors; nBn structure annealing; DETECTORS; SI;
D O I
10.1109/TED.2020.2980887
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The performance of the long-wavelength infrared (LWIR) HgCdTe photodetectors with nBn structure is susceptible to the thickness of barrier layer and the huge mismatch of the energy band between the barrier layer and the absorption layer. Herein, a numerical simulation analysis for LWIR HgCdTe nBn device is carried out to present an enhanced performance with optimized structural and physical parameters (including thickness, doping concentration, and composition). The results provide that the valence band-offset (VBO) could be reduced by structure optimization, and could greatly improve the transport properties of photogenerated carriers. In addition, the effect of composition diffusion caused by the annealing process has also been studied to demonstrate that larger composition diffusion leads to a much higher dark current. The model and calculation results established in this article can provide important theoretical support and guidance for further researches of LWIR HgCdTe nBn devices.
引用
收藏
页码:2001 / 2007
页数:7
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