Electron microscopy and atomic force microscopy in the analysis of profile damage ion in plastic

被引：0
|
作者：
Mendoza-Anaya, D [1 ]
Tavera-Davila, L [1 ]
Perez-Diaz, M [1 ]
Balcazar-Garcia, M [1 ]
Banuelos, JG [1 ]
Saniger-Blesa, JM [1 ]
机构：
[1] Inst Nacl Invest Nucl, Mexico City 06100, DF, Mexico
来源：
ELECTRON MICROSCOPY 1998, VOL 2: MATERIALS SCIENCE 1 | 1998年
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：873 / 874
页数：2
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