Three-Level T-Type Inverter Fault Diagnosis and Tolerant Control Using Single-Phase Line Voltage

被引:22
|
作者
Chao, Kuei-Hsiang [1 ]
Chang, Long-Yi [1 ]
Xu, Fu-Qiang [1 ]
机构
[1] Natl Chin Yi Univ Technol, Dept Elect Engn, Taichung 41170, Taiwan
来源
IEEE ACCESS | 2020年 / 8卷
关键词
Inverters; Circuit faults; Fault diagnosis; Fault tolerance; Fault tolerant systems; Synchronization; Trajectory; Chaos theory; extension theory; fault diagnosis; fault-tolerant control; T-type inverter; STRATEGY; PWM;
D O I
10.1109/ACCESS.2020.2978141
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This study combines extension theory and chaos theory to create a three-level T-type inverter fault diagnosis system that uses single-phase line voltage signals. First, the three-level T-type inverter single-phase line voltage output waveform was measured when faults occurred separately in 12 power transistors. Subsequently, the Lorenz master & x2013;slave dynamic error transformation was used to obtain the chaos eye coordinates, which functioned as fault characteristics. Fault diagnosis involved extension theory & x2013;based fault categorization. Specifically, fault characteristic values were adopted as the input signal to determine the correlation between chaos eyes coordinates and transistor fault, thereby locating faulty transistors. In summary, this study established a low-cost and fast-operating inverter fault diagnosis system. The system integrates detection results with inverter fault-tolerant control to enable the constant operation of inverters in power generation without derating, thereby greatly enhancing system reliability. Finally, the reliability of the smart fault diagnosis system and fault-tolerant control was verified through measurement results.
引用
收藏
页码:44075 / 44086
页数:12
相关论文
共 50 条
  • [1] Single-Phase Bidirectional Three-Level T-Type Inverter
    Yang, Min-Kwon
    Choi, Woo-Young
    [J]. THIRTY-THIRD ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC 2018), 2018, : 2405 - 2408
  • [2] Fault Tolerant Control Methods for Three-Level Boost T-Type Inverter
    Do, Duc-Tri
    Tran, Vinh-Thanh
    Nguyen, Minh-Khai
    Naik, Sanjeev M.
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2023, 70 (06) : 5463 - 5473
  • [3] Fault Diagnosis and Tolerant Control for Three-Level T-Type Inverters
    Chao, Kuei-Hsiang
    Chang, Long-Yi
    Hung, Chien-Chun
    [J]. ELECTRONICS, 2022, 11 (16)
  • [4] A Fault-tolerant T-type Three-Level Inverter System
    Zhang, Wenping
    Liu, Guangyuan
    Xu, Dehong
    Hawke, Joshua
    Garg, Pawan
    Enjeti, Prasad
    [J]. 2014 TWENTY-NINTH ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC), 2014, : 274 - +
  • [5] A Fault Tolerant Control Strategy for Three-Level T-Type Inverter in LVRT/HVRT Operation
    Pang, Xianzhe
    Chi, Shumei
    Ren, Qicai
    Chen, Alian
    [J]. 2024 IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, APEC, 2024, : 2743 - 2748
  • [6] Reliability Improvement of a T-Type Three-Level Inverter With Fault-Tolerant Control Strategy
    Choi, Ui-Min
    Blaabjerg, Frede
    Lee, Kyo-Beum
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2015, 30 (05) : 2660 - 2673
  • [7] Investigation of a Fault-Tolerant Three-Level T-Type Inverter System
    Xu, Shuai
    Zhang, Jianzhong
    Hang, Jun
    [J]. IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2017, 53 (05) : 4613 - 4623
  • [8] Investigation of a Fault-tolerant Three-level T-type Inverter System
    Xu, Shuai
    Zhang, Janzhong
    Hang, Jun
    [J]. 2015 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE), 2015, : 1632 - 1638
  • [9] Fault-Tolerant Methods for Three-Level Boost T-Type Inverter With Capacitor Voltage Reduction
    Do, Duc-Tri
    Tran, Vinh-Thanh
    Le, Hieu-Giang
    Nguyen, Minh-Khai
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2024, 71 (09) : 10739 - 10749
  • [10] Fault-Tolerant Control Strategy for T-Type Three-Level Inverter with Neutral-Point Voltage Balancing
    Chen, Jie
    Chen, Alian
    Xing, Xiangyang
    Zhang, Chenghui
    [J]. 2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC), 2017, : 3420 - 3425