Application of OIM to studies of Cu(In,Ga)Se2 thin films

被引：0
|
作者：
Merrill, JM [1 ]
机构：
[1] USAF, Res Lab, Space Vehicles Directorate, Kirtland AFB, NM 87117 USA
来源：
CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 | 2005年
关键词：
D O I：
10.1109/PVSC.2005.1488170
中图分类号：
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号：
0807 ; 0820 ;
摘要：
Previous work by the author has shown the feasibility of Orientation Imaging Microscopy (OIM) in the microstructural study of Cu(In,Ga)Se-2 thin-films (CIGS). OIM is an automated electron backscatter diffraction technique which is nondestructive and can be used to quickly and easily determine the grain size and structure of a material. The current work compares grain size measurements made with transmission and scanning electron microscopy (TEM, SEM) as compared to Misorientation data for a polycrystalline CIGS sample is also demonstrated.
引用
收藏
页码：465 / 467
页数：3
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