Application of the Multi-element Grid in EMC Uncertainty Simulation

被引:0
|
作者
Bai, Jinjun [1 ]
Guo, Kaibin [1 ]
Sun, Jingchao [2 ]
Wang, Ning [1 ]
机构
[1] Dalian Maritime Univ, Coll Marine Elect Engn, Dalian 116026, Peoples R China
[2] CRRC Dalian R&D Co Ltd, Tract & Control State Key Lab, Dalian 116052, Peoples R China
关键词
Electromagnetic compatibility; uncer-tainty analysis; stochastic collocation method; multi-element grid; POLYNOMIAL CHAOS;
D O I
10.13052/2022.ACES.J.370408
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
??? Uncertainty analysis is a research hotspot in the field of electromagnetic compatibility (EMC) simu-lation. The stochastic collocation method (SCM) is con-sidered particularly suitable for uncertainty analysis in the EMC field because it is characterized by a high level of computational efficiency and accuracy while requir-ing no replacement solver. However, the post-processing process of the SCM is too complex, which will seriously limit its application in many industrial environments such as real-time simulation analysis. Multi-element grid (MEG) is a novel uncertainty analysis method recently for successful application in another area. It is proved that its calculation accuracy is same as the SCM, and its post-processing process is facile. This paper introduces the MEG to the EMC field and makes a detailed compar-ison between it and the SCM in performance, aiming to apply uncertainty analysis to solve more practical EMC engineering problems.
引用
收藏
页码:428 / 434
页数:7
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