Influence of defects in monochromator on curves of diffraction reflections of high-resolution two-crystal X-ray diffractometry

被引：0
|
作者：
Kyslovs'ky, YM [1 ]
Olikhovs'ky, SJ [1 ]
Molodkin, VB [1 ]
Len', YG [1 ]
Vladimirova, TP [1 ]
Reshetnyk, OV [1 ]
Dzyublenko, MI [1 ]
机构：
[1] GV Kurdyumov Met Phys Inst, UA-03680 Kiev, Ukraine
来源：
METALLOFIZIKA I NOVEISHIE TEKHNOLOGII | 2004年 / 26卷 / 09期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The theoretical model of X-ray diffraction in the high-resolution double-crystal diffractometer (DCD) is developed with account for diffuse-scattering effects from defects in monochromator crystals. Their essential influence on the instrumental function of DCD is demonstrated. The comparative analysis of characterization results for defects in various single crystals is carried out both with and without considering such effects that shows necessity of their account for adequate quantitative diagnostics.
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页码：1241 / 1254
页数：14
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