Measuring and evaluating dynamic ADC parameters - Dynamic ADC testing, Part 2

被引:0
|
作者
Hofner, TC [1 ]
机构
[1] Maxim Integrated Prod, Sunnyvale, CA 94086 USA
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
ANALOG-TO-DIGITAL converters (ADCs) represent the link between analog and digital worlds in receivers (Rxs), test equipment, and other electronic devices. As outlined last month in Part 1 of this article series, a number of key dynamic parameters provide a fairly accurate correlation of the performance to be expected from a particular ADC. In this concluding article installment, some of the test setups and measurement procedures for testing the dynamic parameters of high-speed ADCs will be presented. This installment will describe the required software tools, hardware configurations, and test instruments needed to evaluate a 10-b, +3-VDC converter-family example.
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页码:78 / +
页数:8
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