PLAGIARISM DETECTION TOOL FOR ENHANCED ENTITY-RELATIONSHIP DIAGRAMS

被引:7
|
作者
Dahanayake, Hasindu [1 ]
Samarajeewa, Damish [1 ]
Jayathilake, Arosha [1 ]
Bandara, Dinithi [1 ]
Karunasena, Anuradha [1 ]
Weerasinghe, Lokesha [1 ]
机构
[1] Sri Lanka Inst Informat Technol SLIIT, Dept Comp Sci & Software Engn, Malabe, Sri Lanka
关键词
Diagram plagiarism; EER diagrams; Mask R-CNN; Image Processing; OCR; Word2Vec;
D O I
10.1109/UEMCON53757.2021.9666552
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Plagiarism is presenting someone else's work as one's own work without giving credit to the original owner. Recently, plagiarism has become a serious issue in the fields of Education and Technology. To address this issue, many systems have been implemented to detect plagiarism. However, most of them are designed to deal with plagiarism of text content. Detecting plagiarism in figures and diagrams is equally important. Although there is research done on detecting plagiarism in images and flow charts, there is no research done on detecting plagiarism in more complex diagrams such as Enhanced Entity-Relationship (EER) diagrams. This paper presents a methodology to detect plagiarism in EER diagrams using Deep Neural Networks (DNN), image processing techniques, Optical Character Recognition (OCR) techniques, and text similarity detection algorithms. Since the students are aware of the existence of a plagiarism detecting tool, it will encourage the students to do work on their own and it will reduce exam offenses. The similarity report can be presented as proof to the offenders who are not accepting that they have plagiarized others' work Using the proposed system, the EER diagram plagiarism can be detected much faster and accurately. Therefore, the efficiency of marking examinations will be increased. The final outcome of the system will be a similarity report including the plagiarized content in the compared EER diagrams.
引用
收藏
页码:598 / 606
页数:9
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