Piezoresistive effect in the three-dimensional diamondlike carbon nanostructure fabricated by focused-ion-beam chemical vapor deposition

被引:4
|
作者
Kometani, Reo [1 ]
Yusa, Kouki [1 ]
Warisawa, Shin'ichi [1 ]
Ishihara, Sunao [1 ]
机构
[1] Univ Tokyo, Grad Sch Engn, Bunkyo Ku, Tokyo 1138656, Japan
来源
关键词
SILICON-OXIDE FILM; AMORPHOUS-CARBON; GLASS-CAPILLARY; NANOMANIPULATOR; TUNGSTEN; GOLD;
D O I
10.1116/1.3504584
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this study, the electrical material characteristics of a three-dimensional (3D) diamondlike carbon (DLC) structure fabricated by focused-ion-beam chemical vapor deposition (FIB-CVD) were evaluated to realize functional 3D nano- and micromechanical devices based on the piezoresistive material. However, the DLC cantilever structure fabricated by FIB-CVD did not exhibit piezoresistive properties due to the incorporated gallium (Ga), which was implanted by Ga+ FIB irradiation. Therefore, a method for the modification of material characteristics was examined to introduce piezoresistive properties in the 3D DLC structure fabricated by FIB-CVD. Long-time annealing (12 h or more) at a low temperature (300 degrees C) was found to be an effective method to realize a 3D DLC structure with piezoresistive properties. Long-time annealing at low temperatures caused Ga elimination from the DLC without any change in the sp(2)/(sp(2)+sp(3)) ratio. The values of the gauge factor were in the range of 2-34. 3D nano-and microstructures with piezoresistive properties could be realized by FIB-CVD and annealing treatment. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3504584]
引用
收藏
页码:C6F38 / C6F41
页数:4
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