p-Type MgZnO thin films grown using N delta-doping by plasma-assisted molecular beam epitaxy

被引:25
|
作者
Liu, W. W. [1 ,2 ]
Yao, B. [1 ]
Li, Y. F. [1 ]
Li, B. H. [1 ]
Zhang, Z. Z. [1 ]
Shan, C. X. [1 ]
Zhang, J. Y. [1 ]
Shen, D. Z. [1 ]
Fan, X. W. [1 ]
机构
[1] Chinese Acad Sci, Key Lab Excited State Proc, Changchun 130033, Peoples R China
[2] Chinese Acad Sci, Grad Sch, Beijing 100049, Peoples R China
基金
中国国家自然科学基金;
关键词
p-Type; delta-Doping; Zn3N2; MgZnO thin film; ENHANCEMENT; NITROGEN;
D O I
10.1016/j.jallcom.2010.05.148
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Uniform N-doped MgZnO (MgZnO:N) films and the films with layer structure of MgZnO:N/Zn3N2/MgZnO:N (delta-doped MgZnO:N) were grown on c-plane sapphire by plasma-assisted molecular beam epitaxy in the temperature range of 350-650 degrees C, respectively. The delta-doped MgZnO:N shows n-type conductivity in the growth temperatures ranging from 650 to 450 degrees C, but p-type conductivity with hole concentration of 3.41 x 10(17) cm(-3), mobility of 0.49 cm(2)/Vs and resistivity of 48.50 Omega cm at the growth temperature of 350 degrees C. However, all of the MgZnO:N films show n-type conductivity. The p-type delta-doped MgZnO:N is proven to be stable and reproducible, indicating that delta-doping technique combined with low growth temperature is an efficient way to fabricate p-type MgZnO:N films. The effects of the Zn3N2 delta layer on the formation and properties of the p-type delta-doped MgZnO:N is discussed. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
引用
收藏
页码:484 / 487
页数:4
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